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Benchtop EDXRF Spectrometer

Benchtop EDXRF Spectrometer HM-550

【Introduction】Electrically cooled SDD detector and an integrated vacuum system extend elemental coverage from sodium to uranium for alloy and material analysis.
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Product details

Benchtop EDXRF spectrometer model comparison

Benchtop EDXRF spectrometer feature overview

HM-350 XRF application and elemental-range illustration

HM-550 XRF alloy-analysis application examples

HM-350 benchtop XRF cabinet design

XRF analysis software spectral display

HM-550 XRF software and vacuum-control features

HM-550 XRF silicon-drift-detector illustration

HM-550 XRF automatic-test feature illustration

HM-350 XRF protective instrument structure

HM-350 benchtop XRF technical specification table

HM-550 benchtop XRF technical specification table

HM Instruments company and laboratory presentation

Product Overview

The HM-550 from HM Instruments is a benchtop energy-dispersive X-ray fluorescence spectrometer with an electrically cooled silicon drift detector and an integrated vacuum system. Vacuum-assisted measurement reduces air absorption in the X-ray path, supporting the analysis of light elements in compatible samples.

Key Features

  • SDD detection with electrical cooling supports laboratory elemental analysis.
  • Software-controlled vacuum and non-vacuum modes accommodate different sample requirements.
  • Automatic curve selection and selectable collimator/filter combinations support material-specific settings.
  • Spectral display, report printing and real-time vacuum indication support routine work.

Applications

Applications include zinc-aluminum alloys, aluminum alloys, copper alloys, stainless steel, cast iron and suitable coating-analysis tasks. The instrument also supports RoHS-related elemental screening. Choose a validated calibration and measurement arrangement for the matrix, coating geometry and target elements.

Technical Specifications

ParameterSpecification
TechniqueEnergy-dispersive X-ray fluorescence
DetectorElectrically cooled silicon drift detector (SDD)
Element rangeSodium (Na) to uranium (U)
Vacuum systemIntegrated; software-controlled vacuum/non-vacuum selection
Measurement time100–300 seconds, adjustable
X-ray voltage5–50 kV, adjustable
Maximum tube current1 mA
Multichannel analyzerUp to 4096 channels
CommunicationUSB 2.0
Instrument dimensions700 × 510 × 336 mm
Instrument weight56 kg
Ambient temperature15–30 °C
Relative humidity40–70%
SupplyAC 220 V ±5 V

Operation and Selection

Specify the alloy family, target light elements and sample form when selecting the method. Use vacuum only with compatible samples and follow the prescribed loading procedure. XRF elemental screening alone does not determine restricted chemical species or establish complete RoHS compliance.

Product Enquiries

Tell our sales representative your sample material, target inspection or analytical task and configuration requirements for product enquiries and coordination of service requests.

Sales Contact: Arthur
Email: Arthur@hmdzkj.cn
Tel / WhatsApp / WeChat: +86 18353666151


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